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Scanning X‐ray nanodiffraction from ferroelectric domains in strained K 0.75 Na 0.25 NbO 3 epitaxial films grown on (110) TbScO 3
Author(s) -
Schmidbauer Martin,
Hanke Michael,
Kwasniewski Albert,
Braun Dorothee,
von Helden Leonard,
Feldt Christoph,
Leake Steven John,
Schwarzkopf Jutta
Publication year - 2017
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576717000905
Subject(s) - orthorhombic crystal system , crystallography , epitaxy , natural bond orbital , materials science , anisotropy , ferroelectricity , condensed matter physics , lattice (music) , elastic energy , x ray crystallography , diffraction , optics , layer (electronics) , crystal structure , density functional theory , physics , chemistry , nanotechnology , computational chemistry , optoelectronics , thermodynamics , dielectric , acoustics
Scanning X‐ray nanodiffraction on a highly periodic ferroelectric domain pattern of a strained K 0.75 Na 0.25 NbO 3 epitaxial layer has been performed by using a focused X‐ray beam of about 100 nm probe size. A 90°‐rotated domain variant which is aligned along [12] TSO has been found in addition to the predominant domain variant where the domains are aligned along the [12] TSO direction of the underlying (110) TbScO 3 (TSO) orthorhombic substrate. Owing to the larger elastic strain energy density, the 90°‐rotated domains appear with significantly reduced probability. Furthermore, the 90°‐rotated variant shows a larger vertical lattice spacing than the 0°‐rotated domain variant. Calculations based on linear elasticity theory substantiate that this difference is caused by the elastic anisotropy of the K 0.75 Na 0.25 NbO 3 epitaxial layer.