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Evaluation of intragranular strain and average dislocation density in single grains of a polycrystal using K‐map scanning
Author(s) -
Filippelli Ernesto,
Chahine Gilbert,
Borbély András
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716013224
Subject(s) - materials science , dislocation , crystallite , ultimate tensile strength , perpendicular , diffraction , composite material , strain (injury) , crystallography , grain boundary , geometry , microstructure , metallurgy , optics , chemistry , mathematics , physics , medicine
Quick scanning X‐ray microscopy combined with three‐dimensional reciprocal space mapping was applied to characterize intragranular orientation and strain in a single grain of uniaxially deformed Al polycrystal. The strain component perpendicular to the direction of the applied tensile load was found to be very heterogeneous with high compressive and tensile values in the grain interior and near two grain boundaries, respectively. The distribution of the magnitude of diffraction vectors indicates that dislocations are the origin of the strain. The work opens new possibilities for analysing dislocation structures and intragranular residual stress/strain in single grains of polycrystalline materials.