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Asymmetric band flipping for time‐of‐flight neutron diffraction data
Author(s) -
Whitfield Pamela S.,
Coelho Alan A.
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716011961
Subject(s) - neutron , optics , time of flight , neutron diffraction , scattering , neutron scattering , diffraction , resolution (logic) , physics , small angle neutron scattering , computational physics , materials science , molecular physics , crystallography , nuclear physics , chemistry , computer science , artificial intelligence
Charge flipping with powder diffraction data is known to produce a result more reliably with high‐resolution data, i.e. visible reflections at small d spacings. Such data are readily accessible with the neutron time‐of‐flight technique but the assumption that negative scattering density is nonphysical is no longer valid where elements with negative scattering lengths are present. The concept of band flipping was introduced in the literature, where a negative threshold is used in addition to a positive threshold during the flipping. However, it was not tested with experimental data at the time. Band flipping has been implemented in TOPAS together with the band modification of low‐density elimination and tested with experimental powder and Laue single‐crystal neutron data.