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CCP‐FEL: a collection of computer programs for free‐electron laser research
Author(s) -
Maia Filipe R. N. C.,
White Thomas A.,
Loh N. Duane,
Hajdu Janos
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716011134
Subject(s) - free electron laser , computer science , laser , software , range (aeronautics) , data collection , selection (genetic algorithm) , optics , physics , engineering , aerospace engineering , operating system , artificial intelligence , statistics , mathematics
The latest virtual special issue of Journal of Applied Crystallography (//journals.iucr.org/special_issues/2016/ccpfel) collects software for free-electron laser research and presents tools for a range of topics such as simulation of experiments, online monitoring of data collection, selection of hits, diagnostics of data quality, data management, data analysis and structure determination for both nanocrystallography and single-particle diffractive imaging. This article provides an introduction to the special issue.