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Construction of a quartz spherical analyzer: application to high‐resolution analysis of the Ni K α emission spectrum
Author(s) -
Honnicke Marcelo Goncalves,
Bianco Leonardo M.,
Ceppi Sergio A.,
Cusatis Cesar,
Huang XianRong,
Cai Yong Q.,
Stutz Guillermo E.
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716010633
Subject(s) - spectrum analyzer , characterization (materials science) , emission spectrum , resolution (logic) , bar (unit) , high resolution , quartz , spectrum (functional analysis) , physics , representation (politics) , spectroscopy , atomic physics , spectral line , materials science , optics , analytical chemistry (journal) , computational physics , chemistry , remote sensing , computer science , geology , politics , law , political science , chromatography , quantum mechanics , astronomy , artificial intelligence , meteorology , composite material
The construction and characterization of a focusing X‐ray spherical analyzer based on α‐quartz 404 are presented. The performance of the analyzer was demonstrated by applying it to a high‐resolution X‐ray spectroscopy study of the K α 1,2 emission spectrum of Ni. An analytical representation based on physical grounds was assumed to model the shape of the X‐ray emission lines. Satellite structures assigned to 3 d spectator hole transitions were resolved and determined as well as their relative contribution to the emission spectrum. The present results on 1 s −1 3 d −1 shake probabilities support a recently proposed calculation framework based on a multi‐configuration atomic model.