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Element‐specific structural analysis of Si/B 4 C using resonant X‐ray reflectivity. Corrigendum
Author(s) -
Nayak Maheswar,
Pradhan P. C.,
Lodha G. S.
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716003824
Subject(s) - x ray , reflectivity , x ray reflectivity , materials science , crystallography , optics , physics , chemistry
Errors in the article by Nayak, Pradhan & Lodha [ J. Appl. Cryst. (2015), 48 , 786–796] are corrected.