Premium
Quantitative analysis of structural inhomogeneity in nanomaterials using transmission electron microscopy
Author(s) -
Klinger Miloslav,
Polívka Leoš,
Jäger Aleš,
Tyunina Marina
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716003800
Subject(s) - resolution (logic) , image resolution , optics , materials science , lattice (music) , accuracy and precision , position (finance) , electron tomography , transmission electron microscopy , computer science , scanning transmission electron microscopy , physics , artificial intelligence , acoustics , finance , quantum mechanics , economics
A method for quantifying inhomogeneity of crystal structure at the nanoscale is suggested and experimentally verified. The method is based on digital processing of images obtained by high‐resolution transmission electron microscopy. A series of images is acquired and each image is divided into several overlapping sliding windows. Interplanar distances are determined using a fast Fourier transform and the CrysTBox software. A spatial distribution of the estimated distances is obtained considering the size and position of the sliding window within the analysed sample. This approach provides for a picometric precision and accuracy if applied on ideal data. Although this accuracy was verified on experimental data, it can be worsened by errors specific to a particular application and data acquisition technique. The achieved spatial resolution ranges from a few to tens of nanometres. These levels of accuracy, precision and spatial resolution are reached without the need for aberration correction or for a reference lattice parameter, and using samples prepared by focused ion beam milling.