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Microstrain distributions in polycrystalline thin films measured by X‐ray microdiffraction
Author(s) -
Schäfer N.,
Chahine G. A.,
Wilkinson A. J.,
Schmid T.,
Rissom T.,
Schülli T. U.,
Abou-Ras D.
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576716003204
Subject(s) - crystallite , materials science , thin film , stack (abstract data type) , electron backscatter diffraction , diffraction , raman spectroscopy , layer (electronics) , x ray , optics , crystallography , composite material , microstructure , chemistry , nanotechnology , physics , metallurgy , computer science , programming language
Microstrain distributions were acquired in functional thin films by high‐resolution X‐ray microdiffraction measurements, using polycrystalline CuInSe 2 thin films as a model system. This technique not only provides spatial resolutions at the submicrometre scale but also allows for analysis of thin films buried within a complete solar‐cell stack. The microstrain values within individual CuInSe 2 grains were determined to be of the order of 10 −4 . These values confirmed corresponding microstrain distribution maps obtained on the same CuInSe 2 layer by electron backscatter diffraction and Raman microspectroscopy.