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Improvement in X‐ray stress measurement using Debye–Scherrer rings by in‐plane averaging
Author(s) -
Miyazaki Toshiyuki,
Fujimoto Yohei,
Sasaki Toshihiko
Publication year - 2016
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s160057671600128x
Subject(s) - debye , plane (geometry) , stress (linguistics) , fourier series , scherrer equation , materials science , mathematics , fourier transform , mathematical analysis , physics , optics , geometry , diffraction , condensed matter physics , philosophy , linguistics
A technique to improve X‐ray stress measurement using Debye–Scherrer rings is reported. In previous work, a Fourier‐series‐based generalization of the cosα method was proposed, which can measure the stress from a Debye–Scherrer ring. That technique and the cosα method have difficulties in determining the stress when the grain size of the specimen is relatively large and the Debye–Scherrer ring is grainy. To cope with this problem, in‐plane averaging has been used to improve the cosα method when measuring coarse‐grained specimens. In this study, Fourier series analysis is incorporated with in‐plane averaging and it is explained how in‐plane averaging improves the stress measurement. Furthermore, the validity of the new technique is demonstrated by measuring the stress of a carbon steel specimen.