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A laboratory‐based Laue X‐ray diffraction system for enhanced imaging range and surface grain mapping
Author(s) -
Whitley William,
Stock Chris,
Huxley Andrew D.
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576715009097
Subject(s) - detector , goniometer , optics , crystallite , orientation (vector space) , diffraction , sample (material) , materials science , x ray detector , range (aeronautics) , computer science , physics , geometry , mathematics , metallurgy , composite material , thermodynamics
Although CCD X‐ray detectors can be faster to use, their large‐area versions can be much more expensive than similarly sized photographic plate detectors. When indexing X‐ray diffraction patterns, large‐area detectors can prove very advantageous as they provide more spots, which makes fitting an orientation easier. On the other hand, when looking for single crystals in a polycrystalline sample, the speed of CCD detectors is more useful. A new setup is described here which overcomes some of the limitations of limited‐range CCD detectors to make them more useful for indexing, whilst at the same time making it much quicker to find single crystals within a larger polycrystalline structure. This was done by combining a CCD detector with a six‐axis goniometer, allowing the compilation of images from different angles into a wide‐angled image. Automated scans along the sample were coupled with image processing techniques to produce grain maps, which can then be used to provide a strategy to extract single crystals from a polycrystal.