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Large field of view X‐ray microscopy with asymmetric bent crystals and a laboratory source
Author(s) -
Cusatis Cesar
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576715007554
Subject(s) - magnification , bent molecular geometry , optics , wafer , microscopy , field of view , resolution (logic) , critical dimension , microscope , diffraction , reflection (computer programming) , materials science , enhanced data rates for gsm evolution , physics , optoelectronics , computer science , telecommunications , artificial intelligence , composite material , programming language
In microscopy, there is a trade‐off between the magnification and a workable field of view (FOV). In this paper, bent asymmetric diffraction wafers were used with a conventional X‐ray source to accept high divergence and increase the FOV of a two‐dimensional X‐ray microscope. An FOV of 5 mm with 20× magnification was realized with two independent wafers in a thermomechanically stable setup. Using the knife‐edge method, a resolution of 2.5 µm was measured in one dimension. The FOV of such a system is limited by the sizes of the wafers, and the magnification is limited only by the critical angle of external reflection.