Premium
X‐ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient
Author(s) -
Kocharyan V. R.,
Gogolev A. S.,
Movsisyan A. E.,
Beybutyan A. H.,
Khlopuzyan S. G.,
Aloyan L. R.
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576715006913
Subject(s) - perpendicular , temperature gradient , diffraction , bar (unit) , crystal (programming language) , materials science , quartz , single crystal , chemistry , molecular physics , crystallography , optics , physics , geometry , mathematics , quantum mechanics , meteorology , computer science , composite material , programming language
An X‐ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single‐crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X‐cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (). The temperature distribution along the direction perpendicular to the reflecting atomic planes () and the interplanar spacing distribution of atomic planes () are determined as well.