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Fast electron diffraction tomography
Author(s) -
Gemmi Mauro,
La Placa Maria G. I.,
Galanis Athanassios S.,
Rauch Edgar F.,
Nicolopoulos Stavros
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576715004604
Subject(s) - goniometer , tomography , electron tomography , tilt (camera) , diffraction , electron backscatter diffraction , reciprocal lattice , electron diffraction , rotation (mathematics) , crystal (programming language) , materials science , optics , physics , computer science , artificial intelligence , mathematics , scanning transmission electron microscopy , geometry , scanning electron microscope , programming language
A fast and fully automatic procedure for collecting electron diffraction tomography data is presented. In the case of a very stable goniometer it is demonstrated how, by variation of the tilting speed and the CCD detector parameters, it is possible to obtain fully automatic precession‐assisted electron diffraction tomography data collections, rotation electron diffraction tomography data collections or new integrated electron diffraction tomography data collections, in which the missing wedge of the reciprocal space between the patterns is recorded by longer exposures during the crystal tilt. It is shown how automatic data collection of limited tilt range can be used to determine the unit‐cell parameters, while data of larger tilt range are suitable to solve the crystal structure ab initio with direct methods. The crystal structure of monoclinic MgMoO 4 has been solved in this way as a test structure. In the case where the goniometer is not stable enough to guarantee a steady position of the crystal over large tilt ranges, an automatic method for tracking the crystal during continuous rotation of the sample is proposed.