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Laboratory implementation of X‐ray diffraction/scattering computed tomography
Author(s) -
Cersoy Sophie,
Leynaud Olivier,
ÁlvarezMurga Michelle,
Martinetto Pauline,
Bordet Pierre,
Boudet Nathalie,
Chalmin Emilie,
Castets Géraldine,
Hodeau Jean Louis
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714027204
Subject(s) - diffraction , synchrotron radiation , scattering , resolution (logic) , tomography , optics , diffraction tomography , x ray , computed tomography , phase (matter) , materials science , anomalous scattering , synchrotron , characterization (materials science) , physics , computer science , radiology , medicine , quantum mechanics , artificial intelligence
This article demonstrates the possibility to perform X‐ray diffraction/scattering computed tomography experiments with a laboratory diffraction setup. This technique is useful to characterize samples with inhomogeneities on a length scale of a couple of hundred micrometres. Furthermore, the method can be applied to preliminary phase‐selective imaging prior to higher‐resolution characterization using synchrotron radiation. This article presents the results of test experiments carried out on a rhombohedral C 60 sample previously studied at the ESRF.