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An X‐ray diffractometer using mirage diffraction. Erratum
Author(s) -
Fukamachi Tomoe,
Jongsukswat Sukswat,
Ju Dongying,
Negishi Riichirou,
Hirano Keiichi,
Kawamura Takaaki
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714026028
Subject(s) - diffractometer , x ray , negishi coupling , crystallography , diffraction , materials science , chemistry , physics , optics , crystal structure , reagent
Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [ J. Appl. Cryst. (2014), 47, 12671272 ] are corrected.