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Interpretation of two‐dimensional real‐space functions obtained from small‐angle scattering data of oriented microstructures
Author(s) -
FritzPopovski Gerhard
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714024972
Subject(s) - microstructure , scattering , space (punctuation) , fourier transform , interpretation (philosophy) , small angle scattering , optics , materials science , transformation (genetics) , small angle x ray scattering , geometry , computational physics , physics , mathematical analysis , mathematics , computer science , chemistry , composite material , biochemistry , gene , programming language , operating system
The new two‐dimensional indirect Fourier transformation converts small‐angle scattering patterns obtained by means of area detectors into two‐dimensional real‐space functions. These functions contain identical information to the scattering patterns, but many parameters related to the microstructure can be obtained directly from them. The size and shape of the microstructures are mainly reflected in the contours of the real‐space functions. Their height can be used to get information on the internal architecture of the microstructures. The principles are demonstrated on nanostructured silica biotemplated by spruce wood.