Premium
High‐efficiency diffraction and focusing of X‐rays through asymmetric bent crystalline planes
Author(s) -
Bellucci Valerio,
Paternò Gianfranco,
Camattari Riccardo,
Guidi Vincenzo,
Jentschel Michael,
Bastie Pierre
Publication year - 2015
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714024960
Subject(s) - bent molecular geometry , diffraction , curvature , monochromatic color , optics , crystal (programming language) , x ray crystallography , physics , lattice (music) , crystallography , materials science , geometry , chemistry , mathematics , computer science , acoustics , composite material , programming language
The grooving technique was employed for manufacturing a self‐standing curved Ge crystal. The crystal focuses hard X‐rays with high efficiency by diffraction in Laue geometry through asymmetric bent planes. The sample was tested at the Institut Laue–Langevin (Grenoble, France), undergoing two types of characterization. A monochromatic and low‐divergence γ‐ray beam was used to test the curvature of asymmetric planes, showing a diffraction performance better than for any mosaic crystal under equal conditions. Then, the focusing capability of the crystal was probed through a polychromatic and fine‐focus hard X‐ray beam. Asymmetric (220) planes were chosen for analysis because of the impossibility of obtaining a curvature along this family of planes via any symmetric configuration in focusing crystals. A method for calculating the curvatures induced in any family of lattice planes is also presented.