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Reconstruction of crystal shapes by X‐ray nanodiffraction from three‐dimensional superlattices
Author(s) -
Meduňa Mojmír,
Falub Claudiu V.,
Isa Fabio,
Chrastina Daniel,
Kreiliger Thomas,
Isella Giovanni,
von Känel Hans
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714023772
Subject(s) - superlattice , reciprocal lattice , materials science , synchrotron radiation , diffraction , crystal (programming language) , optics , semiconductor , epitaxy , crystallography , optoelectronics , condensed matter physics , physics , layer (electronics) , nanotechnology , chemistry , computer science , programming language
Quantitative nondestructive imaging of structural properties of semiconductor layer stacks at the nanoscale is essential for tailoring the device characteristics of many low‐dimensional quantum structures, such as ultrafast transistors, solid state lasers and detectors. Here it is shown that scanning nanodiffraction of synchrotron X‐ray radiation can unravel the three‐dimensional structure of epitaxial crystals containing a periodic superlattice underneath their faceted surface. By mapping reciprocal space in all three dimensions, the superlattice period is determined across the various crystal facets and the very high crystalline quality of the structures is demonstrated. It is shown that the presence of the superlattice allows the reconstruction of the crystal shape without the need of any structural model.