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Sample tilt‐free characterization of residual stress gradients in thin coatings using an in‐plane arm‐equipped laboratory X‐ray diffractometer
Author(s) -
Benediktovitch Andrei,
Ulyanenkova Tatjana,
Keckes Jozef,
Ulyanenkov Alex
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714022535
Subject(s) - diffractometer , materials science , residual stress , penetration depth , coating , tilt (camera) , penetration (warfare) , x ray , characterization (materials science) , optics , composite material , tin , substrate (aquarium) , residual , geometry , scanning electron microscope , nanotechnology , physics , computer science , metallurgy , mathematics , geology , algorithm , operations research , oceanography
A methodology is presented to characterize residual stress gradients using the sin 2 ψ technique at constant penetration depths without the use of sample χ tilting. The experiments were performed using a laboratory five‐axis X‐ray diffractometer equipped with an in‐plane arm by scanning several reflections in order to enlarge the penetration depth range. The proposed approach, demonstrated on a blasted 11.5 µm‐thick TiN coating on a WC–Co substrate, opens the possibility to perform a complex stress gradient characterization in laboratory conditions where the sample χ tilting can deteriorate the sample properties or experimental conditions, like during in situ high‐temperature studies.