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Angle calculations for an area detector on a two‐axis arm: application to powder diffraction
Author(s) -
Normile P. S.
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714020056
Subject(s) - diffractometer , detector , reciprocal lattice , rotation (mathematics) , azimuth , diffraction , optics , orientation (vector space) , physics , scattering , reduction (mathematics) , orthogonal coordinates , materials science , geometry , mathematics , scanning electron microscope , quantum mechanics
A procedure for the reduction (integration) of a two‐dimensional powder diffraction pattern registered with an area detector after rotation about two orthogonal diffractometer axes is described. The procedure involves the conversion from pixel coordinates to scattering and azimuthal angle {2θ, ψ} coordinates. The article concludes with a mention of two possible applications of the procedure to studies of reciprocal space mapping with an area detector.

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