Premium
Continuous X‐ray multiple‐beam diffraction with primary Bragg angle from 0 to 90°
Author(s) -
Huang XianRong,
Jia Quanjie,
Wieczorek Michael,
Assoufid Lahsen
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s160057671401930x
Subject(s) - monochromator , diffraction , bragg's law , optics , reflection (computer programming) , beam (structure) , azimuth , crystal (programming language) , wavelength , diffraction topography , diffraction efficiency , materials science , x ray , x ray crystallography , physics , computer science , programming language
The interesting phenomenon of continuous multiple‐beam diffraction (MBD) occurring within special crystallographic planes of cubic structures is illustrated for any Bragg angles of the primary reflection. On the one hand, this effect must be avoided in crystal‐based X‐ray optics or general crystal diffraction experiments that are designed to utilize two‐beam diffraction mechanisms, since the MBD process can significantly reduce the diffraction efficiency and the monochromatization quality. On the other hand, the continuous MBD mechanism may have unique practical applications, with the advantage that it can be activated at arbitrary X‐ray wavelengths by simply adjusting the azimuthal angle of the primary reflection. A simple mathematical procedure for determining the continuous MBD planes of any primary reflections is developed for optimization of X‐ray monochromator designs and for general X‐ray characterization of (pseudo)cubic structure crystals using MBD.