Premium
High diffraction efficiency with hard X‐rays through a thick silicon crystal bent by carbon fiber deposition
Author(s) -
Camattari Riccardo,
Dolcini Enrico,
Bellucci Valerio,
Mazzolari Andrea,
Guidi Vincenzo
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714018834
Subject(s) - bent molecular geometry , materials science , radius of curvature , diffraction , optics , silicon , bending , deposition (geology) , bend radius , fabrication , crystal (programming language) , curvature , optoelectronics , composite material , physics , geometry , geology , mathematics , mean curvature , mean curvature flow , computer science , paleontology , programming language , sediment , alternative medicine , pathology , medicine
The diffraction capability of two crystalline silicon plates bent by carbon fiber deposition has been studied. The performed treatment induced a permanent curvature in the samples, resulting in an increase of the diffraction efficiency. The obtained efficiencies are constant over a wide angular range and close to the theoretical expectations, meaning that the curvatures were homogeneous. Most importantly, the bending technique allowed the manufacture of bent samples up to 5 mm thick and with a radius of curvature down to 30 m. With such a technique, the fabrication of crystals for the realization of a hard X‐ray concentrator (Laue lens) for astrophysical purposes is enabled.