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Resolution function for X‐ray powder diffraction in a noncoplanar measurement geometry with the detector arm having two degree of freedom
Author(s) -
Benediktovitch Andrei,
Ulyanenkova Tatjana,
Ulyanenkov Alex
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714012412
Subject(s) - detector , diffractometer , resolution (logic) , powder diffractometer , optics , anisotropy , convolution (computer science) , materials science , x ray , powder diffraction , geometry , beam (structure) , diffraction , physics , mathematics , nuclear magnetic resonance , computer science , scanning electron microscope , artificial intelligence , machine learning , artificial neural network
A noncoplanar measurement geometry, achieved by using a diffractometer equipped with a detector arm possessing two degrees of freedom, is a promising technique for the analysis of residual stress gradients in polycrystalline objects and for anisotropic microstructure investigations. The instrumental function for a parallel beam and a set of two orthogonal receiving Soller slits is considered in detail, and the explicit analytical expressions in terms of a convolution of functions are derived. A comparison of the calculated results with the measured profiles from a NIST SRM 660b LaB 6 powder standard sample shows a good agreement.