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An X‐ray diffractometer using mirage diffraction
Author(s) -
Fukamachi Tomoe,
Jongsukswat Sukswat,
Ju Dongying,
Negishi Riichirou,
Hirano Keiichi,
Kawamura Takaaki
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714012114
Subject(s) - diffractometer , monochromator , bent molecular geometry , crystal (programming language) , diffraction , collimator , materials science , optics , resolution (logic) , crystallography , diffraction topography , x ray crystallography , crystal structure , physics , chemistry , wavelength , programming language , artificial intelligence , computer science , composite material
Some characteristics are reported of a triple‐crystal diffractometer with a (+, −, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractometer are that its setup is easy, its structure is simple, the divergence angle from the second crystal is small and the energy resolution of the third crystal is high, of the order of sub‐meV.