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Connecting heterogeneous single slip to diffraction peak evolution in high‐energy monochromatic X‐ray experiments
Author(s) -
Pagan Darren C.,
Miller Matthew P.
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714005779
Subject(s) - diffraction , slip (aerodynamics) , monochromatic color , materials science , x ray crystallography , single crystal , silicon , electron backscatter diffraction , crystallography , optics , physics , chemistry , thermodynamics , optoelectronics
A forward modeling diffraction framework is introduced and employed to identify slip system activity in high‐energy diffraction microscopy (HEDM) experiments. In the framework, diffraction simulations are conducted on virtual mosaic crystals with orientation gradients consistent with Nye's model of heterogeneous single slip. Simulated diffraction peaks are then compared against experimental measurements to identify slip system activity. Simulation results compared against diffraction data measured in situ from a silicon single‐crystal specimen plastically deformed under single‐slip conditions indicate that slip system activity can be identified during HEDM experiments.