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Energy‐dispersive X‐ray diffraction mapping on a benchtop X‐ray fluorescence system
Author(s) -
Lane David W.,
Nyombi Antony,
Shackel James
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576714000314
Subject(s) - crystallite , diffraction , spectrometer , pellets , x ray crystallography , materials science , x ray fluorescence , x ray , optics , electron backscatter diffraction , analytical chemistry (journal) , fluorescence , chemistry , physics , metallurgy , chromatography , composite material
A method for energy‐dispersive X‐ray diffraction mapping is presented, using a conventional low‐power benchtop X‐ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X‐ray maps with a 10 µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X‐rays. The maps showed that the crystallites in the Bi pellet were larger than those observed in the Pb and steel pellets. The application of benchtop spectrometers to energy‐dispersive X‐ray diffraction mapping is discussed, and the capability for lower atomic number and lower‐symmetry materials is briefly explored using multi‐crystalline Si and polycrystalline sucrose.