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Multiple application X‐ray imaging chamber for single‐shot diffraction experiments with femtosecond X‐ray laser pulses
Author(s) -
Song Changyong,
Tono Kensuke,
Park Jaehyun,
Ebisu Tomio,
Kim Sunam,
Shimada Hiroki,
Kim Sangsoo,
GallagherJones Marcus,
Nam Daewoong,
Sato Takahiro,
Togashi Tadashi,
Ogawa Kanade,
Joti Yasumasa,
Kameshima Takashi,
Ono Shun,
Hatsui Takaki,
Iwata So,
Yabashi Makina,
Ishikawa Tetsuya
Publication year - 2014
Publication title -
journal of applied crystallography
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.429
H-Index - 162
ISSN - 1600-5767
DOI - 10.1107/s1600576713029944
Subject(s) - femtosecond , laser , optics , diffraction , materials science , x ray , photon , free electron laser , scattering , physics
X‐ray free‐electron lasers (XFELs) provide intense (∼10 12 photons per pulse) coherent X‐rays with ultra‐short (∼10 −14 s) pulse lengths. X‐rays of such an unprecedented nature have introduced new means of atomic scale structural investigations, and discoveries are still ongoing. Effective use of XFELs would be further accelerated on a highly adaptable platform where most of the new experiments can be realized. Introduced here is the multiple‐application X‐ray imaging chamber (MAXIC), which is able to carry out various single‐pulse diffraction experiments including single‐shot imaging, nanocrystallographic data acquisition and ultra‐fast pump–probe scattering for specimens in solid, liquid and gas phases. The MAXIC established at the SPring‐8 ångström compact free‐electron laser (SACLA) has demonstrated successful applications in the aforementioned experiments, but is not limited to them. Also introduced are recent experiments on single‐shot diffraction imaging of Au nanoparticles and serial crystallographic data collection of lysozyme crystals at SACLA.