Mapping of a particular element using an absorption edge with an X‐ray fluorescence imaging microscope | Zendy

Yamamoto Kimitake | Zendy; Watanabe Norio | Zendy; Takeuchi Akihisa | Zendy; Takano Hidekazu | Zendy; Aota Tatsuya | Zendy; Fukuda Masanori | Zendy; Aoki Sadao | Zendy

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Mapping of a particular element using an absorption edge with an X‐ray fluorescence imaging microscope

Author(s) -

Yamamoto Kimitake,

Watanabe Norio,

Takeuchi Akihisa,

Takano Hidekazu,

Aota Tatsuya,

Fukuda Masanori,

Aoki Sadao

Publication year - 2000

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049599014260

Subject(s) - monochromatic color , x ray fluorescence , beamline , magnification , optics , microscope , materials science , absorption edge , absorption (acoustics) , x ray , microscopy , fluorescence , analytical chemistry (journal) , physics , chemistry , optoelectronics , beam (structure) , chromatography , band gap

An X‐ray fluorescence imaging microscope with a Wolter‐type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring‐8. Monochromatic X‐rays (Δ E / E ≃ 10 −4 ) in the energy range 6–10 keV were used for X‐ray fluorescence excitation of the specimens. Using two monochromatic X‐rays above and below the absorption edge of a particular element, a two‐dimensional image of the element could be obtained. As a result, two‐dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite‐quartz schist) became possible.

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