Open AccessMapping of a particular element using an absorption edge with an X‐ray fluorescence imaging microscope
Author(s) -
Yamamoto Kimitake,
Watanabe Norio,
Takeuchi Akihisa,
Takano Hidekazu,
Aota Tatsuya,
Fukuda Masanori,
Aoki Sadao
Publication year - 2000
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599014260
Subject(s) - monochromatic color , x ray fluorescence , beamline , magnification , optics , microscope , materials science , absorption edge , absorption (acoustics) , x ray , microscopy , fluorescence , analytical chemistry (journal) , physics , chemistry , optoelectronics , beam (structure) , chromatography , band gap
An X‐ray fluorescence imaging microscope with a Wolter‐type objective mirror (magnification: 13) has been constructed at beamline 39XU of SPring‐8. Monochromatic X‐rays (Δ E / E ≃ 10 −4 ) in the energy range 6–10 keV were used for X‐ray fluorescence excitation of the specimens. Using two monochromatic X‐rays above and below the absorption edge of a particular element, a two‐dimensional image of the element could be obtained. As a result, two‐dimensional element mapping of the test specimens (Cu, Co, Ni, Fe and Ti wires) and constituent minerals (Fe, Mn and Ti) of a rock specimen (a piemontite‐quartz schist) became possible.