Open AccessA high‐precision X‐ray beam‐position and profile monitor for synchrotron beamlines
Author(s) -
Van Silfhout R. G.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599010596
Subject(s) - synchrotron radiation , optics , synchrotron , beam (structure) , monochromatic color , photodiode , physics , position (finance) , characterization (materials science) , materials science , economics , finance
A novel monitor for X‐ray beam position, intensity and profile is presented. This diagnostic instrument is based on a commercial photodiode array which detects X‐rays scattered diffusely from a featureless foil. The typical accuracy with which the beam position is determined is 1 µm. Although initially conceived for the characterization of `white' synchrotron radiation, this monitor has proven to be suitable for monochromatic radiation as well, hence providing a single solution to the task of beam characterization along the X‐ray beam path, from source to sample.