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X‐ray focusing using an inclined Bragg‐reflection lens
Author(s) -
Hrdý J.,
Siddons D. P.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599005385
Subject(s) - optics , focus (optics) , reflection (computer programming) , diffraction , beam (structure) , bragg's law , crystal (programming language) , lens (geology) , groove (engineering) , materials science , plane (geometry) , physics , focal length , machining , geometry , mathematics , computer science , metallurgy , programming language
An experimental demonstration showing that a one‐dimensional focus can be produced by using the principle of inclined diffraction from a perfect crystal is presented. By machining a groove with a controlled cross‐sectional profile it is shown that it is possible to vary the out‐of‐plane deviations in a controlled manner and hence generate a focus. Also demonstrated is the use of four reflections in (−,+,+,−) dispersive geometry resulting in the cancellation of all beam‐spreading in the orthogonal direction. The experiment used an energy of 15 keV with a source‐to‐crystal distance of 13.5 m and crystal‐to‐focus distance of 4.5 m. A focus of width 0.29 mm was produced from an incident beam of width 2.7 mm. It is clear from the measurements that a better surface finish would result in a smaller focal spot.

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