
`Atomic' XAFS as a probe of electronic structure
Author(s) -
Ramaker D. E.,
O'Grady W. E.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599003921
Subject(s) - x ray absorption fine structure , electronic structure , atomic physics , materials science , chemistry , physics , computational chemistry , spectroscopy , quantum mechanics
Atomic XAFS (AXAFS) offers die potential for a new tool to gain relatively detailed electronic structure and polarization information on systems, in-sit'u, that may not contain long range geometric order. We have shown previously that AXAFS can monitor ch_anges in die charge of less than 0.05e per surface Pt atom on a metallic cluster, and "sees" interactions from ions 2 and 3 shells removed from die absorber atom. The AXAFS lineshape allows a differentiation between the through space field polarization and the through bond inductive effects. Applications have been made to in situ Pt electrodes, ion.cation interactions in solution, and supported noble metal catalysts.