Open AccessXAFS studies of interfaces in MnSe/ZnTe superlattices
Author(s) -
Kropf A. J.,
Bunker B. A.,
Furdyna J. K.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599001703
Subject(s) - x ray absorption fine structure , superlattice , materials science , chemistry , crystallography , physics , optoelectronics , spectroscopy , quantum mechanics
Polarization-dependent XAFS measurements of a series of MnSe/ZnTe superlattices are presented. The results are consistent with a small interdiffusion at the interfaces, accompanied by an elastic distortion of the bond angles. This is in contrast to earlier measurements of other II-VI semiconductor superlattices. In addition, the Zn-Se bond expands by 0.027_+0.012~ to accommodate the strain in the superlattice.