Open AccessX‐ray powder diffraction with hybrid semiconductor pixel detectors
Author(s) -
Manolopoulos S.,
Bates R.,
BushnellWye G.,
Campbell M.,
Derbyshire G.,
Farrow R.,
Heijne E.,
O'Shea V.,
Raine C.,
Smith K. M.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599001107
Subject(s) - diffraction , diffractometer , optics , scintillator , detector , powder diffractometer , powder diffraction , pixel , materials science , synchrotron radiation , image resolution , resolution (logic) , physics , synchrotron , optoelectronics , nuclear magnetic resonance , scanning electron microscope , computer science , artificial intelligence
Semiconductor hybrid pixel detectors, originally developed for particle physics experiments, have been used for an X‐ray diffraction experiment on a synchrotron radiation source. The spatial resolution of the intensity peaks in the diffraction patterns of silicon and potassium niobate powder samples was found to be better than that of a scintillator‐based system, typically used at present. The two‐dimensional position information of the pixel detector enabled multi‐peak diffraction patterns to be acquired and clearly resolved without the need for an angle scan with a diffractometer. This trial experiment shows the potential of this technology for high‐resolution high‐rate diffraction systems.