
Solid and liquid short‐range structure determined by EXAFS multiple‐scattering data analysis
Author(s) -
Di Cicco A.,
Minicucci M.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049599000771
Subject(s) - x ray absorption fine structure , scattering , extended x ray absorption fine structure , range (aeronautics) , local structure , materials science , short range order , interatomic potential , molecular physics , computational physics , chemistry , chemical physics , crystallography , molecular dynamics , physics , optics , computational chemistry , spectroscopy , absorption spectroscopy , composite material , quantum mechanics
Reliable determination of local structure in ordered and disordered matter can be obtained by using advanced data-analysis methods (GNXAS) taking proper account of multiple-scattering terms and atomic background shapes. We report about recent XAFS application on liquid and solid systems at high temperature taking advantage of the pertbrmances of the BM29 experimental installation at the ESRF. Results on a molten superionic system (AgI) and a pure metal (Rh) at very high temperatures (up to about 2300 K) are compared witll computer simulations based on published interatomic potentials. XAFS is shown to be able to give important information on local structure and on the short-range part of the interatomic interaction.