Open AccessError analysis of EXAFS measurements
Author(s) -
Krappe H. J.,
Rossner H.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598018172
Subject(s) - extended x ray absorption fine structure , chemistry , materials science , physics , optics , absorption spectroscopy
A method to analyze EXAFS data is proposed which follows the error propagation from the measured input data to the output of the physical parameters taking into account experimental and systematic errors. The Bayesian approach is used to describe the modification of the a priori expectation for the model parameters due to the measurement. A description is discussed to determine the relative weight of the a priori information compared to the experimental information in their impact on the results for the a posteriori expectation values and their variances. Computer generated data above the Ta L3-edge are used to demonstrate the robustness of the method.