Open AccessCollecting XAFS spectra at soft X‐ray energies in a heated loop cell up to 1600 K
Author(s) -
Farges F.,
Flank A.M.,
Lagarde P.,
Ténégal F.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598017749
Subject(s) - x ray absorption fine structure , loop (graph theory) , spectral line , x ray , materials science , atomic physics , physics , chemistry , analytical chemistry (journal) , optics , spectroscopy , mathematics , combinatorics , quantum mechanics , astronomy , chromatography
International audienceA new device to collect in-situ-, high-temperature XAFS spectra is presented which runs at low x-ray energies (K edges from Na to Cl). XAFS data is collected in the fluorescence mode (Ge solid state detector) using a heated loop that contains the sample. The actual temperature is measured using an optical pyrometer and a thermocouple (temperatures are +/- 20 K at 1500 K). The first XAFS spectra were collected at the Si K-edge, with 0.2 eV steps, on the ABS1 spectrometer at Super-AGO (LURE, Orsay). The study of the melting of a Na2Si2O5 glass is an example of the possibilities offered by this new area of research