Open AccessMicro‐XANES by EPMA spectrometer
Author(s) -
Kawai J.,
Hayashi K.,
Takahashi H.,
Kitajima Y.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598017270
Subject(s) - xanes , spectrometer , electron microprobe , analytical chemistry (journal) , materials science , physics , chemistry , optics , metallurgy , environmental chemistry , spectroscopy , astronomy
XANES (X-ray absorption near edge structure) spectrum of an area of a few tens of square micrometers of MgO is measured with an EPMA (electron probe X-ray microanalyzer) using a novel method -EXEFS (extended X-ray emission fine structure) method -proposed by the present authors. The EXEFS method has the following six remarkable characteristics: (1) high energy resolution, (2) high spatial resolution, (3) short measuring time, (4) easy sample preparation, (5) convenient without using synchrotron radiation facilities, and (6) good at measuring soR X-ray absorption spectra.