Micro‐XANES by EPMA spectrometer | Zendy

Kawai J. | Zendy; Hayashi K. | Zendy; Takahashi H. | Zendy; Kitajima Y. | Zendy

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Micro‐XANES by EPMA spectrometer

Author(s) -

Kawai J.,

Hayashi K.,

Takahashi H.,

Kitajima Y.

Publication year - 1999

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049598017270

Subject(s) - xanes , spectrometer , electron microprobe , analytical chemistry (journal) , materials science , physics , chemistry , optics , metallurgy , environmental chemistry , spectroscopy , astronomy

XANES (X-ray absorption near edge structure) spectrum of an area of a few tens of square micrometers of MgO is measured with an EPMA (electron probe X-ray microanalyzer) using a novel method -EXEFS (extended X-ray emission fine structure) method -proposed by the present authors. The EXEFS method has the following six remarkable characteristics: (1) high energy resolution, (2) high spatial resolution, (3) short measuring time, (4) easy sample preparation, (5) convenient without using synchrotron radiation facilities, and (6) good at measuring soR X-ray absorption spectra.

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