Rapid and sensitive XAFS using a tunable X‐ray undulator | Zendy

Oyanagi H. | Zendy; Ishii M. | Zendy; Lee C. | Zendy; Saini N. L. | Zendy; Kuwahara Y. | Zendy; Saito A. | Zendy; Izumi Y. | Zendy; Hashimoto H. | Zendy

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Rapid and sensitive XAFS using a tunable X‐ray undulator

Author(s) -

Oyanagi H.,

Ishii M.,

Lee C.,

Saini N. L.,

Kuwahara Y.,

Saito A.,

Izumi Y.,

Hashimoto H.

Publication year - 1999

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049598017245

Subject(s) - x ray absorption fine structure , undulator , x ray , materials science , optics , physics , chemistry , radiation , spectroscopy , astronomy

We describe the design and performance of a high-brilliance XAFS station at BL10XU of SPring-8 planned for rapid and sensitive Xray absorption fine structure (XAFS). A deflection parameter K-y of undulator and a double crystal monochromator have been successfully tuned to cover a wide range in energy (5-30 keV). For a high throughput fluorescence data acquisition, a 100-pixel Ge detector has been developed which allows a total count rate exceeding 30 MHz with a typical energy resolution of 270 eV at 5.9 keV. A three-axis high-precision goniometer is designed to provide any polarization geometry including a grazing-incidence fluorescence excitation

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