Open AccessRapid and sensitive XAFS using a tunable X‐ray undulator
Author(s) -
Oyanagi H.,
Ishii M.,
Lee C.,
Saini N. L.,
Kuwahara Y.,
Saito A.,
Izumi Y.,
Hashimoto H.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598017245
Subject(s) - x ray absorption fine structure , undulator , x ray , materials science , optics , physics , chemistry , radiation , spectroscopy , astronomy
We describe the design and performance of a high-brilliance XAFS station at BL10XU of SPring-8 planned for rapid and sensitive Xray absorption fine structure (XAFS). A deflection parameter K-y of undulator and a double crystal monochromator have been successfully tuned to cover a wide range in energy (5-30 keV). For a high throughput fluorescence data acquisition, a 100-pixel Ge detector has been developed which allows a total count rate exceeding 30 MHz with a typical energy resolution of 270 eV at 5.9 keV. A three-axis high-precision goniometer is designed to provide any polarization geometry including a grazing-incidence fluorescence excitation