Interpreting atomic resolution EELS spectra using multiple scattering theory | Zendy

Moltaji H. O. | Zendy; Buban J. P. | Zendy; Browning N. D. | Zendy

AI Assistant Blog Pricing

Home ZAIA Blog

Open Access

Interpreting atomic resolution EELS spectra using multiple scattering theory

Author(s) -

Moltaji H. O.,

Buban J. P.,

Browning N. D.

Publication year - 1999

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049598016884

Subject(s) - spectral line , scattering , resolution (logic) , atomic physics , chemistry , materials science , physics , molecular physics , optics , computer science , quantum mechanics , artificial intelligence

By performing electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) it is possible to obtain atomic spatial resolution spectra from individual defects. Using the multiple scattering methodology originally developed for X-ray absorption Near-Edge Structure (XANES), the fine-structure of the energy loss spectra can be directly related to the local 3-dimensional atomic structure. This type of analysis allows unique structure models to be developed for defects, on which a fundamental understanding of the structure-property relationships can be based. The application of this technique is demonstrated here for a 25 ° [001] tilt grain boundary in SrTiO3.

The content you want is available to Zendy users.

Already have an account? Click here to sign in.

Having issues? You can contact us here

Accelerating Research