Open AccessInterpreting atomic resolution EELS spectra using multiple scattering theory
Author(s) -
Moltaji H. O.,
Buban J. P.,
Browning N. D.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598016884
Subject(s) - spectral line , scattering , resolution (logic) , atomic physics , chemistry , materials science , physics , molecular physics , optics , computer science , quantum mechanics , artificial intelligence
By performing electron energy loss spectroscopy (EELS) in a scanning transmission electron microscope (STEM) it is possible to obtain atomic spatial resolution spectra from individual defects. Using the multiple scattering methodology originally developed for X-ray absorption Near-Edge Structure (XANES), the fine-structure of the energy loss spectra can be directly related to the local 3-dimensional atomic structure. This type of analysis allows unique structure models to be developed for defects, on which a fundamental understanding of the structure-property relationships can be based. The application of this technique is demonstrated here for a 25 ° [001] tilt grain boundary in SrTiO3.