The ESRF beamline ID26: X‐ray absorption on ultra dilute sample | Zendy

Gauthier C. | Zendy; Solé V. A. | Zendy; Signorato R. | Zendy; Goulon J. | Zendy; Moguiline E. | Zendy

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The ESRF beamline ID26: X‐ray absorption on ultra dilute sample

Author(s) -

Gauthier C.,

Solé V. A.,

Signorato R.,

Goulon J.,

Moguiline E.

Publication year - 1999

Publication title -

journal of synchrotron radiation

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.172

H-Index - 99

ISSN - 1600-5775

DOI - 10.1107/s0909049598016835

Subject(s) - beamline , x ray absorption spectroscopy , materials science , sample (material) , absorption (acoustics) , analytical chemistry (journal) , optics , physics , chemistry , absorption spectroscopy , chromatography , beam (structure)

The ESRF beamline ID26 is dedicated to XAFS studies on Ultra-diluted Samples (XAUS beamline). The spectral range 2.3-30 keV is covered. The aim of the beamline is to extract structural and electronic information on dilute samples for which the concentration of the absorbing element ranges from a few ppm up to 10 000 ppm. A wide range of applications is covered in biology, catalysis, chemistry, environmental sciences, solid state physics, etc. The beamline accepted the first users in November 1997. We give herein a brief description of the beamline and report on recent results.

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