
The ESRF beamline ID26: X‐ray absorption on ultra dilute sample
Author(s) -
Gauthier C.,
Solé V. A.,
Signorato R.,
Goulon J.,
Moguiline E.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598016835
Subject(s) - beamline , x ray absorption spectroscopy , materials science , sample (material) , absorption (acoustics) , analytical chemistry (journal) , optics , physics , chemistry , absorption spectroscopy , chromatography , beam (structure)
The ESRF beamline ID26 is dedicated to XAFS studies on Ultra-diluted Samples (XAUS beamline). The spectral range 2.3-30 keV is covered. The aim of the beamline is to extract structural and electronic information on dilute samples for which the concentration of the absorbing element ranges from a few ppm up to 10 000 ppm. A wide range of applications is covered in biology, catalysis, chemistry, environmental sciences, solid state physics, etc. The beamline accepted the first users in November 1997. We give herein a brief description of the beamline and report on recent results.