Open AccessImprovement in the structural characterization of nanometer‐scale metallic oxide. The Xas–Awaxs combined approach
Author(s) -
Bazin D.,
Revel R.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598015088
Subject(s) - nanometre , spinel , extended x ray absorption fine structure , oxide , diffraction , scattering , x ray absorption spectroscopy , characterization (materials science) , materials science , chemistry , crystallography , physics , nanotechnology , absorption spectroscopy , optics , metallurgy
The goal of this paper is to show that major information can be obtained even on poorly ordered supported oxide metallic through a Exafs-Awaxs combined approach. To illustrate our purpose we choose spinel compounds and thus we first consider the reference compound ZnAl2O4. Structural information coming from the second coordination sphere, particular attention has to be paid to photoelectron multiple scattering processes and we have already shown that multiple scattering contributions (table 1) cannot be neglected (BAZIN et al.; 1998). For diffraction, the starting point is given by a simulation of the experimental diagram using the Rietveld method (FULLPROF) in order to test the value of f’ and f”.