Open AccessEdge separation using diffraction anomalous fine structure
Author(s) -
Ravel B.,
Bouldin C. E.,
Renevier H.,
Hodeau J.L.,
Berar J.F.
Publication year - 1999
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598013648
Subject(s) - diffraction , enhanced data rates for gsm evolution , spectral line , range (aeronautics) , materials science , k edge , chemistry , physics , crystallography , optics , computer science , telecommunications , astronomy , composite material
We exploit the crystallographic sensitivity of the Diffraction Anomalous Fine-Structure (DAFS) measurement to separate the fine structure contributions of different atonfic species with closely spaced resonant energies. In BaTiO3 the Ti K edge and Ba Lm edges are separated by 281 eV, or about 8.2 .~-l , thus severely linfiting the information content of the Ti K edge signal. Using the site selectivity of DAFS we can separate the two fine structure spectra using an iterative Kramers-Kronig method, thus extending the range of the Ti K edge spectrum. This technique has application to many rare earth/transition metal compounds, including many magnetic materials of technological significance for which K and L edges overlap in energy.