Open AccessTime‐resolved fluorescent X‐ray interference
Author(s) -
Sasaki Y. C.,
Suzuki Y.,
Yamanashi H.,
Arai A.,
Yanagihara M.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598002787
Subject(s) - fluorescence , interference (communication) , optics , radiation , excited state , detector , beam (structure) , materials science , physics , atomic physics , channel (broadcasting) , electrical engineering , engineering
A fluorescent X‐ray interference method can effectively measure nanometer‐level conformational changes for non‐crystallized molecules and proteins in aqueous conditions. The time‐resolved technique can be used to obtain information about the dynamics of molecules and proteins. Instrumentation for time‐resolved fluorescent X‐ray interference has been designed. A typical interference‐fringe pattern was observed with approximately 3 s of X‐ray exposure time from K ‐fluorescent X‐rays emitted from a Zn monoatomic layer on an Rh substrate. The primary X‐ray beam was polychromed with a mirror for total external reflection of X‐rays and was tuned to an energy level at which only Zn K radiation became optimally excited. The glancing angle of the primary X‐ray beam was fixed at a glancing angle at which the total intensity of K ‐fluorescent X‐rays emitted from Zn atoms corresponded to the maximum value. The fluorescent X‐ray interference fringes were monitored with an imaging plate (IP) as a non‐energy‐dispersive two‐dimensional detector. The exposed interference fringes on the IP were integrated along the direction of the fringes. The integrated fringes were in close agreement with a theoretical estimate based on the interference among transmitted and reflected waves at interfaces in the sample.