Open AccessMaterial analysis end‐station of the Hyogo‐ken beamline at SPring‐8
Author(s) -
Kaneyoshi T.,
Ishihara T.,
Yoshioka H.,
Motoyama M.,
Fukushima S.,
Hayashi K.,
Kawai J.,
Taniguchi K.,
Hayakawa S.,
Gohshi Y.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598001502
Subject(s) - beamline , optics , goniometer , spring 8 , diffraction , physics , beam (structure) , materials science
Plans to construct surface‐analysis equipment which will be placed on beamline BL24XU of SPring‐8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface‐analysis equipment is the simultaneous measurement of fluorescent and diffracted X‐rays in grazing‐incidence geometry. The instrument is equipped with a solid‐state detector (SSD) and a flat position‐sensitive proportional counter (PSPC) combined with analysing crystals for X‐ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X‐ray diffraction. X‐ray fluorescence holography and polarized X‐ray emission spectroscopy modes are available, so three‐dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.