Open AccessAvalanche Photodiodes as Fast X‐ray Detectors
Author(s) -
Kishimoto Shunji
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049598000053
Subject(s) - avalanche photodiode , detector , nanosecond , photodiode , optics , x ray detector , physics , diode , optoelectronics , synchrotron , photodetector , apds , resolution (logic) , materials science , laser , computer science , artificial intelligence
An avalanche photodiode (APD) detector provides a sub‐nanosecond time resolution and an output rate of more than 10 8 counts s −1 of synchrotron X‐rays. Moreover, the APD has the advantage of low noise. A review of recent developments of detectors using APD devices designed for X‐ray experiments is presented in this paper. One of the detectors has an excellent time response of 100 ps resolution and a narrow width on its response function, 1.4 ns at 10 −5 maximum. The other consists of a stack of four diodes and has a transmission structure. The stacked detector improved the efficiency for X‐rays, e.g. 55% at 16.53 keV. The output rates reached more than 10 8 counts s −1 per device.