Open AccessSpectrometer for polarized soft X‐ray Raman scattering
Author(s) -
Harada Y.,
Ishii H.,
Fujisawa M.,
Tezuka Y.,
Shin S.,
Watanabe M.,
Kitajima Y.,
Yagishita A.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597019481
Subject(s) - spectrometer , undulator , beamline , optics , photon energy , scattering , raman spectroscopy , raman scattering , x ray spectroscopy , physics , spectroscopy , photon , materials science , beam (structure) , quantum mechanics
An experimental system for polarized soft X‐ray Raman scattering spectroscopy has been constructed. The soft X‐ray spectrometer is based on the Rowland circle geometry with a holographic spherical grating. Three types of gratings are used to cover the energy range from 18 eV to 1200 eV. According to a ray‐trace simulation, the resolution is expected to be 200 meV at 700 eV by using a 10 µm slit width. The polarized and depolarized soft X‐ray Raman scattering spectra can be measured by rotating the soft X‐ray spectrometer around the axis of the incident beam. Preliminary measurements of polarized and depolarized spectra were accomplished at undulator beamline BL‐2C of the Photon Factory.