Open AccessThe Soft X‐ray Scanning Photoemission Microscopy Project at SRRC
Author(s) -
Ko ChengHao,
Klauser Ruth,
Wei DerHsin,
Chan HeiHing,
Chuang T. J.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597018955
Subject(s) - undulator , beamline , microprobe , synchrotron radiation , optics , analyser , brightness , materials science , synchrotron , sample (material) , microscope , physics , beam (structure) , nuclear physics , thermodynamics
The Synchrotron Radiation Research Center (SRRC) and the Institute of Atomic and Molecular Sciences (IAMS) have initiated a project to construct a scanning photoelectron spectromicroscopy end station at SRRC (SRRC‐SPEM). High‐brightness soft X‐rays will be provided by the U5 undulator beamline. Zone‐plate‐based soft X‐ray optics will be used to focus the beam to form the microprobe. A hemispherical sector analyser with multichannel detection capability will collect the photoelectrons. A total of up to 32 images can be acquired concurrently. The apparatus is also equipped with a sample distribution system for in situ sample preparation and characterization in conjunction with other surface spectroscopic techniques.