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Focusing and reflection by a bent crystal for high‐energy synchrotron radiation
Author(s) -
Yamaoka Hitoshi,
Ohtomo Kiyotaka,
Ishikawa Tetsuya
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597018657
Subject(s) - bent molecular geometry , synchrotron radiation , reflection (computer programming) , synchrotron , high energy x rays , optics , crystal (programming language) , high energy , radiation , physics , materials science , engineering physics , computer science , beamline , composite material , programming language , beam (structure)
The focusing properties and resolution of a doubly bent crystal in the Bragg case have been analytically studied from a geometrical viewpoint. Simulation using the Takagi–Taupin equations was also performed for singly bent crystal reflections to study the reflectivity. The critical radius of curvature for changing from dynamical to kinematical diffraction is calculated to be of the order of a few tens of metres for an Si 400 reflection of 110 keV X‐rays.

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