Open AccessX‐ray diffraction with a Bragg angle near π/2 and its applications
Author(s) -
Kikuta S.,
Imai Y.,
Iizuka T.,
Yoda Y.,
Zhang X.W.,
Hirano K.
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597018621
Subject(s) - diffraction , bragg's law , x ray , optics , materials science , x ray crystallography , diffraction topography , physics , crystallography , chemistry
X‐ray dynamical diffraction phenomena at a Bragg angle near π/2 are studied. The X‐ray transmissivity as well as the reflectivity from the (991) lattice plane of a silicon thin plate is observed. It agrees fairly well with the diffraction pattern calculated on the basis of the Darwin approach. The possibility is discussed whether a set of two crystal plates arranged face to face, in which the diffraction condition with a Bragg angle near π/2 is satisfied, may be used as a very high resolution monochromator.