Open AccessObservation of the strain field near the Si(111) 7 × 7 surface with a new X‐ray diffraction technique
Author(s) -
Emoto Takashi,
Akimoto Koichi,
Ichimiya Ayahiko
Publication year - 1998
Publication title -
journal of synchrotron radiation
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.172
H-Index - 99
ISSN - 1600-5775
DOI - 10.1107/s0909049597017792
Subject(s) - diffraction , optics , materials science , surface (topology) , reflection (computer programming) , bragg's law , oxide , surface reconstruction , total internal reflection , field (mathematics) , x ray , physics , geometry , mathematics , computer science , pure mathematics , metallurgy , programming language
A new X‐ray diffraction technique has been developed in order to measure the strain field near a solid surface under ultrahigh vacuum (UHV) conditions. The X‐ray optics use an extremely asymmetric Bragg‐case bulk reflection. The glancing angle of the X‐rays can be set near the critical angle of total reflection by tuning the X‐ray energy. Using this technique, rocking curves for Si surfaces with different surface structures, i.e. a native oxide surface, a slightly oxide surface and an Si(111) 7 × 7 surface, were measured. It was found that the widths of the rocking curves depend on the surface structures. This technique is efficient in distinguishing the strain field corresponding to each surface structure.